Espectrofotometro X-Rite i1Photo Pro 3 Plus

 Measurement aperture: 8 mm (0.31”) diameter (effective measurement aperture

 during scanning is depending on the patch size and measurement speed)

0.3 ∆E00* average, 0.8 ∆E00* max. (deviation from X-Rite manufacturing standard at a temperature

of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º))

 Chinese (Simplified), English, French, German, Italian, Japanese, Korean,

 Portuguese, Spanish

 Minimal Patch Size in Scanning Mode: 16 x 16 mm (0.63” x 0.63”)

 (Width x Height) with sensor ruler 20 x 16 mm (0.79” x 0.63”)

 (Width x Height) without sensor ruler

 MAC: Intel® Core 2 Duo CPU or better; WINDOWS: Intel® Core 2 Duo

 or AMD Athlon™ XP or better

 i1® technology with built-in wavelengths check; Holographic diffraction grating

 with 128-pixel diode array

 Choose between a ‘basic’, wizard-driven interface or an ‘advanced’, user-driven interface

 for highest level professional results

 MAC: Latest drivers for video card installed

 WINDOWS: Latest drivers for video card installed, dual display support requires

 either 2 video cards or a dual head video card that supports dual video LUTs being loaded

 Twelve (12) months from the date of sale, unless different local regulations apply.

 Product registration is required to receive X-Rite technical support during the warranty period.

 Registration can occur directly through the software, on our website, or via phone.

 Users are encouraged to register their product within the first 30 days of use.